3D atomic force microscope by Oxford Instruments Asylum Research
The MFP-3D Infinity atomic force microscope (AFM) from Oxford Instruments Asylum Research features a 90 µm stage and closely located control electronics for low noise.
The MFP-3D Infinity atomic force microscope (AFM) from Oxford Instruments Asylum Research (Santa Barbara, CA) features a 90 µm stage and closely located control electronics for low noise. The instrument's head and scanner enable sensor noise <35 pm in z and <150 pm in x and y, and feature top- and bottom-view optics that provide a large field of view and diffraction-limited resolution for pinpointing features on a sample. A Fast Force Mapping mode, which operates at a 300 Hz pixel rate (max), captures force curves in the image without missing curves or performing hidden data manipulation.
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